We offer Portable Surface Roughness Tester in super compact designs. These are packed with powerful functions for convenient operations. It is small & light weight and measures flat, horizontal, vertical and overhead surfaces. It has rechargeable battery option and can store ten complete data records.

 

Super Compact Design packed with Powerful Functions and Ease at on-site measurements.

All Functions for convenient Operations

Complies with all common surface standards such as ISO, DIN,CNOMO,JIS,ASME

Data Memory/Battery Operation : Ten complete Data records can be stored.Rechargeable battery operation provides versatile use away from apower source.

Measuring in different positions: The small and light handysurf measures not only flat,horizontal,but also vertical and overhead surfaces.

Direct data Transfer to the PC- The RS 232 serial interface is used to transfer measured data,parameters and profile curves  directly to the PC.

 

Specifications:

• Measuring Range: Z axis +/- 160 um, X Axis 12.5 mm
• Resolution : 0.01 um
• Standards: JIS 2001, JIS-1994,JIS 1982,ISO-1984,DIN-1990,ASME-1995,CNOMO
• Parameters: Pt, Ra, Rq, Rz, Rzmax, Rp, Rt, R3z, RSm, Pc, Rk, Rpk, Rvk, Mr1, Mr2, VO, K, Rmr, R, Rx, AR, W, Wx, AW, Wte
• Evaluation Curves: Section Profile Curve,Roughness Curve,ISO 13565

The Surface Roughness Tester offered by us measures surface texture of metal and non-metal parts. The small and compact size makes it easily transportable. The artificial intelligence functions automatically selects the ideal cut off value, measuring range and other conditions. It is user friendly and supports wide range of styli options.

SURFCOM 130 A MAKE: ZEISS

• Top Flight Performance in Production
• Best of class Straightness Accuracy 0.3um/50 mm

Salient features:

• Easy Change of Stlii
• Wide Range of stylii options
• 50 mm traverse length,built in datum plane and large measuring range detector
• Selectable Amplifier LCD touch panel
• Handy, compact use
• Analysis paramters catering to worldwide requirements
• Artificial Inteligence functions automatically selects the ideal cut off value,measuring range and other conditions.This automates measurement.
• Host of Analysis Functions- incorporates 34 types of roughness  and 32  waviness parameters.
• Tilt Correction Function: Six type of automatic tlit correction are provided.
• Evaluation Range Setting- The waveform on the screen is enclosed by two cursors,allowing the desired range to be set and the parameters to be calculated.
• PC Card Slot- Measuring Conditions, Measured result management or mesared data can be output in binary and text format.

SPECIFICATIONS:

Measuring Range- X Axis- 50mm ,
Z axis - 800µ mm (Measuring range  resolution: 800µ mm/10nm, 80µmm/1nm, 8 µ mm/0.1nm
Straighness accuracy-  0.3µm/50mm

 
Analysis items:
            
Standards : Complies with JIS-2001, JIS-1994, JIS-19822, ISO- 1997, ISO-1984, DIN-1990, ASME-1995, CNOMO.       

Parameters :  Ra, Rq, Ry, Rp, Rv, Rc, Rz, Rmax, Rt, Rz,J, R3z, Sm, S, R Δa, R Δq, R λa, R λq, TILT A, Ir, Pc, Rsk, Rkpk, Rvk, Mr1, Mr2, VO, K, tp, Rmr, Tp2, Rmr2, R δc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR 

Evaluation curves: Section profile curve, filtered waviness curve, foltered center line waviness curve, rolling circle waviness curve, rolling circle center line waveness curve, DIN4776 special curve, roughness motif curve, envelope waviness curve

Surface Characteristics graphs: Bearing area, curve, amplitude distribution (ADF) curve, power graph

TILT Correction: Linear correction, first half correction, latter half correction, both end correction, spline curve correction 

Magnification: Vertical (Z-axis)- 50-100K Auto, Horizantal (X-axis): 1-5K auto

Detector : Tip radius 2µm, material diamond 

Special functions: Artificial Inteligence functions, step analysis, PC card 

Standard Accessories: Standard specimen, Recording Paper,Touch Pen, Instruction Manual                                                                                            

The Surface Roughness Tester offered by us measures surface texture of metal and non-metal parts. The small and compact size makes it easily transportable. The artificial intelligence functions automatically selects the ideal cut off value, measuring range and other conditions. It is user friendly and supports wide range of styli options.

SURFCOM 1500DX/SD

Linear motor drive achieves low vibration texture measurements

 

• First  roughness Mesurement instrument with Linear motor: The new linear motor enables the world's fastest measurement speeds and low vibration for stable, high-magnification measurement. A linear, non-contact drive unit and simple ensures vibration-free and stable, long-term operation.
• High speed measuring for dramatically improved productivity:Very high speed of 3mm/s maximum for roughness measuring, 20mm/s maximum for wave measuring, 60mm/s maximum for movement speed. it is 5 to 10 times better than other ACCRETECH machines.
• High-performance compact pickup:
  Measuring range is 1000µm with and outside diameter of 14 mm, and magnification of 500K 
• Smaller footprint:
  A new modern design reduces the system footprint by 25%.
  
• A leader in Expandablity:
  You can upgrade from 2D to 3D roughness measurement of support both roughness )
  
• Patented Artificial Intelligence Function simplifies Measuring:the measuring instrument selects suitable roughness setting and analyzing condition that are not pre-configured.
• Full Automation improves Measuring Efficiency:
  A moving speed of 6mm/s dramatically improves measuring when full automatic.

• TIMS Flexible Measuring system:
• World wide Machine:Freedom to Re-analyze after a single Measurement:
• Dramaticaly Enhanced profile Evalution functions:
  

Flexible input and output functions:

Specification:

Measuring range/ resolution: Z-axis (vertical): 1000µm/ 0.02µm to 6.4µm/0.0001µm     X-axis(horizontal): 100mm/0.04 µm or 32,000 points (300,000 data uptake points)

Straigtness: 0.05+ 1.0L/1,000µm L-Measuring lenth

Analysis items:Standards : Complies with JIS-2001, JIS-1994, JIS-1982, ISO- 1997, ISO-1984, DIN-1990, ASME-1995, CNOMO.       

Parameters :  Ra, Rq, Ry, Rp, Rv, Rc, Rz, Rmax, Rt, Rz,J, R3z, Sm, S, R Δa, R Δq, R λa, R λq, TILT A, Ir, Pc, Rsk, Rkpk, Rvk, Mr1, Mr2, VO, K, tp, Rmr, Tp2, Rmr2, R δc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR 

Evaluation curves: Section profile curve, filtered waviness curve, foltered center line waviness curve, rolling circle waviness curve, rolling circle center line waveness curve, DIN4776 special curve, roughness motif curve, envelope waviness curve

Surface Characteristics graphs: Bearing area, curve, amplitude distribution (ADF) curve, power graph

TILT Correction: Linear correction, first half correction, latter half correction, both end correction, spline curve correction

Magnification:
Vertical (Z-axis): 50-500K, arbitrary, auto
Horizantal(X-axis): 0.1- 20K arbitrary, auto

Deector: Tip radius: 2µm, Material: Diamond

Special functions: Artificial intelligence functions, Waveform superimposition, Automatic Operation. Specifications:

SURFCOM 480A    MAKE:ZEISS
Operater-oriented operation for the workplace
New surface texture measuring instrument for easy operation.

Salient Features:

• TFT Color LCD touch panel
• Supports International standards: The 480A supports JIS(2001/1994/1982),ISO,DIN,ASME andCNOMO standards.
• Customize icons: The customized function can be used to create a special mene where only the icons that are used most frequently are displayed.
• Analysis parameters catering to worldwide requirements

• Artificial Intelligence functions automatically selects the ideal cut off value, measuring range and other conditions. This automates measurement.

• Host of Analysis Functions- incorporates 34 types of roughness  and 32  waviness parameters.

• Tilt Correction Function: Six type of automatic tlit correction are provided.

• Evaluation Range Setting- The waveform on the screen is enclosed by two cursors, allowing the desired range to be set and the parameters to be calculated.

• PC Card Slot- Measuring Conditions, Measured result management or measured data can be output in binary and text format.

SPECIFICATIONS:

Measuring Range- X Axis- 100mm ,
Z axis - 800µ mm (Measuring range  resolution: 800µ mm/10nm, 80µmm/1nm, 8 µ mm/0.1nm

Straightness accuracy-  (0.05=1.5L/100)µm
 
 Analysis items:
            
Standards : Complies with JIS-2001, JIS-1994, JIS-19822, ISO- 1997, ISO-1984, DIN-1990, ASME-1995, CNOMO.       

Parameters :  Ra, Rq, Ry, Rp, Rv, Rc, Rz, Rmax, Rt, Rz,J, R3z, Sm, S, R Δa, R Δq, R λa, R λq, TILT A, Ir, Pc, Rsk, Rkpk, Rvk, Mr1, Mr2, VO, K, tp, Rmr, Tp2, Rmr2, R δc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR 

Evaluation curves: Section profile curve, filtered waviness curve, faltered center line waviness curve, rolling circle waviness curve, rolling circle center line waviness curve, DIN4776 special curve, roughness motif curve, envelope waviness curve

Surface Characteristics graphs: Bearing area, curve, amplitude distribution (ADF) curve, power graph

TILT Correction: Linear correction, first half correction, latter half correction, both end correction, spline curve correction 

Magnification: Vertical (Z-axis)- 50-500K, Auto,
Horizontal (X-axis): 1-2K auto

Detector : Tip radius 2µm, material diamond, Measuring force: 0.75mN 

Special functions: Artificial Intelligence functions, step analysis, PC card 

Standard Accessories: 
Standard specimen, Recording Paper, Touch Pen, Instruction Manual