Portable Surface Roughness Tester (Skid less)

SURFCOM TOUCH 50 system come with an intuitive and easy-to-use screen for condition setting, calibration, measurement and analysis. An amplifier with a 7-inch wide touch panel and a new interface provides higher operability. Easy-to-use operation eliminates the need of instructions. The high performance pickup with an extended measurement range from 800 to 1,000 μm and a Z-axis minimum resolution of 0.0001 μm allows for wide-range and high resolution skidless measurement. In addition to a flat surface, the roughness or waviness on an undulating surface such as a stepped or round surface can be evaluated with one trace.

SURFCOM TOUCH 50 has skid less measurement with a high-performance pickup while having high resolution and with a wide measuring range. Various types of workpieces can be measured by changing the stylus for deep, long, or small holes or a round surface.

Description

Technical Specifications
Z direction ±500 μm
X direction 50 mm
Evaluation Length 0.1 to 50 mm
Straightness accuracy 0.3 μm/50 mm
Detector vertical movement volume 50 mm
Measurement Speed 0.15, 0.3, 0.6, 1.5, 3 / 0.05, 0.1, 0.2, 0.5, 1 mm/s (Switching)
Pickup Sensing type Differential inductance
Measurement Method Skid less/Skid (optional)
Z direction resolution 0.0001 μm/±40 μm, 0.00125 μm/±500 μm
Measurement force 0.75 mN
Stylus Radius rtip = 2 μm
Stylus Angle 60°cone
Stylus Material Diamond
Calculation Standards Comply with JIS2013/2001, JIS1994, JIS1982, ISO1997/2009, ISO13565, DIN1990, ASME2002/2009, ASME1995, CNOMO
Parameter – Profile Curve Pa, Pq, Pp, Pv, Pc, PSm, PΔq, PPc, Psk, Pku, Pt, Pmr(c), Pmr, Pδc, Rz82, TILTA, AVH, Hmax, Hmin, AREA, Rmax, Rz, Sm, Δa, Δq, λa, λq, Lr, Rsk, Rku, Rk, Rpk, Rvk, Mr1, Mr2, Vo, K, tp, tp2, Hp
Parameter – Roughness Curve Ra, Rq, Rz, Rv, Rc, Rt, RSm, RΔq, Rsk, Rku, Rmr(c), Rmr, Rδc, Rz94, R3z, RΔa, Rλa, Rλq, Ry, Lr, Sm, S, tp, tp2, PC, RPc JIS, RPc ISO, RPc EN, Pc, PPI, Rp, Rmax, Rz.I, RS, Rmr2, Mr1, Mr2, Rpk, Rvk, Rk, Vo, K, A1, A2, Rpm, Δa, Δq, Htp
Parameter – Waviness Profile Curve Wa, Wq, Wt, Wp, Wv, WSm, WPc, Wsk, Wmr(c), Wmr, Wδc, Wz, Wc, Wku, WΔq, WEM, WEA, WE-a, WE-q, WE-p, WE-v, WE-Sm, WEC-q, WEC-m, WEC-p, WEC-v, WEC-Sm
Parameter – Motif R, Rx, AR, W, Wx, AW, Rke, Rpke, Rvke, NCRX, NR, CPM, SR, SAR, Wte, NW, SAW, SW, Mr1e, Mr2e, Vo, K
Evaluation Curve Profile Curve, Roughness Curve, Filtered Waviness Curve, Waviness Profile Curve, ISO13565 Special Roughness Curve, Roughness motif curve, Waviness motif curve, Upper envelope waviness curve, Rolling Circle Waviness Curve
Characteristics graph Abbot curve, Amplitude density function, Power graph
Filter type Gaussian, 2RC (phase compensation), 2RC (non-phase compensation)
Cutoff value – λc 0.08, 0.25, 0.8, 2.5, 8, 25 mm
Cutoff value – λs None, 2.5, 8, 25 μm
Display 7-inch color liquid crystal touch panel
Data output USB connectors for USB memory, Micro USB connector for USB communication
Print output Inbuilt Thermal printer
Language Japanese, English, Chinese (Traditional Chinese/Simplified Chinese), Korean, Thai, Malay, Vietnamese, Indonesian, German, French, Italian, Czech, Polish, Hungarian, Turkish, Swedish, Dutch, Spanish, Portuguese
Power Supply AC100 to 240 V ±10%, 50/60 Hz, Single phase
Power Supply – Charging Built-in battery (to be charged using AC adaptor), charging period: 3 hours (about 600 measurements can be take when fully charged)
Power consumption Maximum 80 VA
External dimensions Amplification indicator : 320 x 167 x 44 mm/about 4.2 kg for the entire system
Standard accessories Roughness specimen (E-MC-S24C), touch pen (E-MA-S112A), printing paper (E-CH-S25A)*1, instruction manuals, SupportWare II

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